Choo / Perez-Pons / Upadhyay / Lu / Chow

Erschienen: 03.06.2026

Digital Forensics and Cyber Crime

16th EAI International Conference, ICDF2C 2025, Miami, FL, USA, November 17–19, 2025, Proceedings,Part II

Springer

ISBN 978-3-032-22544-3

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Bibliografische Daten

Fachbuch

Buch. Softcover

2026

33 s/w-Abbildungen, 139 Farbabbildungen.

In englischer Sprache

Umfang: xx, 560 S.

Format (B x L): 15,5 x 23,5 cm

Verlag: Springer

ISBN: 978-3-032-22544-3

Produktbeschreibung

This two-volume set, LNICST 685 and 686, constitutes the refereed post-conference proceedings of the 16th EAI International Conference on Digital Forensics and Cyber Crime, ICDF2C 2025, Miami, FL, USA, during November 17–19, 2025. The 66 full papers and 1 poster paper included in these volumes were carefully reviewed and selected from 163 submissions. They have been organized in the following topical sections: Part I: AI and Machine Learning in Digital Forensics: Papers applying AI, LLMs, and deep learning to detect anomalies,enhance forensics, or improve model reliability; Digital Forensics and Incident Response: Focused on forensic investigation, evidence recovery, data analysis, and structured workflows; Adversarial Machine Learning and Attack Detection: Addressing adversarial AI, attack simulation, and defensive mechanisms; and Cyber Threat Intelligence and Malware Analysis: Focus on malware detection, honeynets, phishing, traffic analysis, and intrusion defense. Part II: Cyber Threat Intelligence and Malware Analysis: Focus on malware detection, honeynets, phishing, traffic analysis, and intrusion defense; Digital Evidence Management, Blockchain, and Privacy: Addressing blockchain forensics, data provenance, and privacy-preserving computation; Critical Infrastructure and Cyber-Physical Security: Cyber resilience in physical and industrial systems, including IoT, satellites, and SCADA; Legal, Policy, and AI Governance in Digital Forensics: Studies bridging AI governance, digital law, compliance, and socio-technical policy; and Posters & Demos.

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