Advanced Characterization Methods for the Analysis of Electrical Losses in Perovskite/Silicon Tandem Solar Cells

Photovoltaics enable large-scale generation of clean electricity. Multi-junction solar cells allow increasing power conversion efficiency significantly, reducing land and resource demand. This work introduces novel, rapid, and spatially resolved characterization methods for a comprehensive electrical loss analysis of perovskite/silicon tandem solar cells, focusing on short-circuit current, open-circuit voltage, and fill factor. The quick spectrometric characterization enables the investigation of subcell currents within minutes. Lock-in thermography and photoluminescence measurements allow identifying local defects and spatial patterns in dual- and triple-junction solar cells. The luminescence-based implied open-circuit voltage imaging technique reveals local voltage losses. The Suns-VOC and Suns-PL imaging methods are adapted for tandem cells to quantify transport losses. The photoluminescence-based series resistance imaging can uncover spin-coating-induced defects and allows quantification of the corresponding electric losses. Collectively, this work provides essential methods for targeted development of high-efficiency perovskite/silicon multi-junction photovoltaics.